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Institute for Materials Research

Surface characterisation

  • Topometrix Atomic Force Microscope with Micro Thermal Analysis Attachment.
    • Agilent 5420 with AFM, KFM, PFM and MFM capability. With external magnetic field capability.
    • Quantachrome Aotosorb-1, automatic gas and vapour adsorption apparatus with chemisorption facility. Micropore model with DFT software.
    • AFM with Micro Thermal Analysis Attachment
    • Access to extensive range of AFM/STM facilities in IPSE and Physics
    • Quantachrome Autosorb-1, automatic gas and vapour adsorption apparatus with chemisorption facility. Micropore model with DFT software
    • Benchtop Secondary Ion Mass Spectrometry (Mech Eng)
    • Additional Surface Analysis Equipment in Physics:
    • VG Sigmaprobe with small area XPS and field emission AES
    • UHV-STM
    • Atomic force Microscopy (AFM)
    • Scanning Tunnelling Microscopy (STM)
    • Low temperature STM
    • Contact Angle Apparatus
    • Surface Analysis Facilities (optical) (In Physics)
    • Ellipsometry (including spectroscopic capability)
    • Surface Plasmon Resonance (Spectroscopy and Imaging)
    • Confocal Microscopy